Talk:Ellipsometry

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Resolution[edit]

Hi, I'm sorry by I dont agree with your statement, Bobblewik about ellipsometry. The fact that the technique and modern equipment is capable of determining differences of the order of amstrongs is NOT the same as nanometers (ten times less accurate).

Please if you have doubts about the technique or the physics involved ask away. Askewmind 16:19, Feb 19, 2005 (UTC)

Ellipsometry Plans[edit]

Hi everyone interested. I'm working on providing a full article on Ellipsometry, from basic principles to complex modelling of data and maybe some particular cases of organic films or metal oxides. Any suggestions appreciated. Askewmind 02:09, Feb 20, 2005 (UTC)

Some of this work may be delay a few months now, I'll try to keep an eye and add material as soon as I can, in the mean time contributions are more than welcomed. Askewmind | (Talk) 01:50, 13 May 2005 (UTC)[reply]

We'll wait your supplement. thanks.Honeyzjj 15:29, 21 Jun 2005 (UTC)

i just added two manufacturers. Note that Gaertner uses a completly different approach (not moving parts such as polarisers) which may merit an article of itself (the technique not the company!)?

there is a statement in the article about multiple layers for modelling. since with PCSA one usually only get 2 parameters there is only so much that you can model ... Benkeboy 13:38, 17 May 2006 (UTC)[reply]

This is not true. You indeed get only 2 parameters, but you could get these for different wavelengths and angles, ending up with whole matrices of parameters. With these, you can model multiple layers for sure! 84.195.248.116 (talk) 10:41, 16 February 2008 (UTC)[reply]

It says that ellipsometry does not require calibration and is insensitive to scattered light. I would say that since it involve moving parts (the polarisers) it does require calibration of alignment of the polarisers. Since no surface is mathematically flat (and the polarisers are not 100% effective) there will always be scattered light that affects the accuracy of the measurements. Compare to what happens with a really rough surface, there is so much scatter that it becomes difficult to measure and to built appropriate models, although "simpler" for VASE over PCSA. Benkeboy 14:20, 17 May 2006 (UTC)[reply]

To answer your question about not requiring calibration above. An ellipsometer will initially need to be calibrated after it is manufactured and/or installed. The comment in this article was referring to NOT needing to calibrate on each sample. Like other methods that are intensity base you need to calibrate first. Ellipsometry uses change in polarization NOT change in intensity.

A correction to my statement above: Not all ellipsometers use moving parts to determine the optical constants, e.g. Stokes ellipsometry or when the polariser are made with liquid crystals. Benkeboy 09:37, 13 June 2007 (UTC)[reply]

List of manufacturers[edit]

Should an wikipedia article contain a list of manufacturers? anyway Jasco Inc and Ellipso Technology seem to have disappeared, at least their websites were down now. Benkeboy 09:37, 13 June 2007 (UTC) There are many manufactures, even Accurion GmbH is one who sells imaging ellipsometers — Preceding unsigned comment added by 46.223.224.176 (talk) 11:52, 27 August 2015 (UTC)[reply]

Ellipsometer Pictures[edit]

As Benkeboy said, a wiki page should not be commercial. As a result I suggests not including pictures of any commercial ellipsometers in this article. Anybody having a picture of a "homemade" ellipsometer is welcomed. —Preceding unsigned comment added by Bixente44 (talk • contribs) 15:02, 10 December 2007 (UTC)[reply]

Historical Interest[edit]

Wouldn't it be good to mention Ludvig Lorenz at some point? He discovered that light reflected by a thin transition layer between two media becomes elliptically polarised in the first place. The article about him on Wikipedia already links to this page after all. Geoffpointer (talk) 23:45, 27 April 2017 (UTC)[reply]